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Laytec Epix Environmental Equipment & Supplies
1 equipment items found
Manufactured by:LayTec AG based inBerlin, GERMANY
EpiX Mapping stations combine an XY-mapping stage with LayTec spectroscopic reflectance and photoluminescence metrology systems for a comprehensive 2D analysis of optical wafer properties by non-contact measurements. Integrated software provides full automated data analysis, including detection of VCSEL optical parameters (cavity dip, stop-band position), single layer and multiple layer thickness ...
